Size and temperature effects on dielectric breakdown of ferroelectric films

Abstract The paper introduces a model of dielectric breakdown strength. integrated thermal and defect models, representing the relationship between electric field ferroelectric films dimensional parameters operating temperature. This is verified with experimental results lead lanthanum zirconate titanate (PLZT) various film thickness ( d = 0.8–3 μm), electrode area A 0.0020–25 mm 2 ) tested under range temperature T 300–400 K) satisfying fitting results. Also learned that recoverable energy density directly proportional to square field. found viable in predicting terms variables , for PLZT films.